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ZEON begins sales of high-performance etching gas for next-generation semiconductors, enables fine detail work for next-generation logic circuits and giga-bit memory chip

December 2,1998


Zeon begins sales of a new etching gas called ZFL-58 (octafluorocyclopentene) from December 10, that will enable the fine detail work on silicon wafers necessary for the coming generation of logic circuits and giga-bit-class LSI memory chips.

Tokyo Electron Limited has conducted performance evaluations on the gas for the past year. As a result of the tests, the gas was found to be a high-performance etching gas for the processing of fine detail work that is known to be difficult to accomplish.

The gas can also be used with currently-employed high- and medium-density oxide film etching systems and has a high etch-selectivity rate for resist and silicon-nitride film that conventional etching gases have never achieved.

The gas has other exceptional characteristics, namely that it does not deplete the ozone layer and has an extremely low global warming factor. We will positively contribute to the preservation of the Earth's environment by promoting the use of ZFL-58.

1. Basic performance
  ZFL-58 not only avoids depleting the ozone layer, it also has a very short lifespan in the atmosphere (0.98 years) compared with conventional gases like CF4 (50,000 years) and C4F8 (3,200 years). The global warming factor is also a comparatively low 90 (integrated value of 100 years with CO2 equal to 1) compared with conventional gas (CF4: 6500, C4F8: 8700). Thus, ZFL-58 is an excellent compound with which to preserve the ozone layer and the Earth's environment.
2. Performance as an etching gas
  Use of this gas permits a large etch-selectivity rate for silicon-nitride film, resist and silicon to silicon oxide film. This feature allows the processing of the fine detail work required for the coming generation of logic circuits and giga-bit-class LSI memory chips, a feat that has been very difficult to achieve so far.

Three processes have been found to be effective: the dual damascene process, the self-aligned contact (SAC) process and the small contact process. These processes have been tested and proven by Tokyo Electron Limited since last year.

Tests were carried out not only by Japanese semiconductor manufacturers but also by many other manufacturers in America, Europe, Korea and Taiwan.
3. History of development
  Since 1989, ZFL-58 has been developed in cooperation with the National Institute of Materials and Chemical Research (NIMC), which belongs to the Agency of Industrial Science and Technology (AIST), part of Japan's Ministry of International Trade and Industry. ZEON has been conducting research and development as a part of our comprehensive C5 fraction utilization strategy.

4. Production
  A production plant has already been completed at ZEON's Takaoka Plant in Takaoka City, Toyama Prefecture.
ZEON plans to exhibit our ZFL-58 etching gas at Semicon-Japan '98 in Makuhari, Chiba Prefecture, from December 2 through 4.

For more information
  • ZEON Corporation, Corporate Communications & Public Affairs
    Tel: +81-3-3216-2747

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