ZEP7000
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High-Resolution Positive EB Resist for Mask Fabrication
ZEP 7000 is a positive tone electron beam resist for high resolution with excellent dry-etching resistance.

Features
Extremely high resolution
Excellent dry-etching resistance, as high as photo resists
Accelerated drawing machines


Lineup
Resist Solvent Viscosity
(mPa•s)
Thinner
ZEP7000 Diglyme 17, 22 ZEP-D

Developer Dry etching
process
Wet etching
process

Puddle
development

Spray
development
ZED-500
ZED-750  

Rinse ZMD-D Stripper ZDMAC

fig1
Process Conditions

Substrate :

  4inch Si Wafer
DEV.:
ZED-500, 23C°,
  180 sec
Film thickness :   5000°C   ZED-750, 23C°,   180 sec
Bake :   180°C, 180 sec (Hot plate)        
EXP :   ELS-3300, 20 keV        

Dry etching rate

fig2
CF4 Dry Etching Condition
0.15 torr, 70?qcm, 200W
Cl2+O2 Dry Etching Condition
Cl2/O2=4/1,5 min

Pattern profile after dry etchinge
fig3
ICP

Pattern profile after dry etchinge
fig4 fig5 fig6 fig7
0.5µm 0.4µ枸 0.3µm 0.3µ枸


Linearity
fig8
Process Conditions
FilmaThichness : 400Å
Exposure : 50 keV
Pattern : isolated hole
Development : ZED-500
Rince : ZMD-D
Dry Etcher : ICP




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